Sinton Lifetime Measurement WCT-120TS

The WCT-120TS (Temperature Stage) instrument showcases the unique measurement and analysis techniques found with our WCT-120 instrument with the added capability to measure the carrier recombination lifetime of silicon wafers at temperatures ranging from 25°C to 200°C. Both the Quasi- Steady-State Photoconductance (QSSPC) lifetime measurement method developed by Sinton Instruments as well as the transient photoconductance decay technique can be used to measure wafer lifetime with this tool.

Primary application:

Measuring carrier recombination lifetimne in silicon wafers at a range of temperatures.

Other Applications:

-Monitoring initial material quality

-Detecting heavy metals contamination during wafer processing

-Evaluating surface passivation and emitter dopant diffusion

-Evaluating process-induced shunting using the implied I-V measurement


Buyer Notice

1. About the product

Due to market fluctuations, exchange rate changes, and other factors, product prices and product attributes are for reference only; The specific product requirements are subject to customer requirements, and the prices are subject to communication and quotation. All product prices on this website are not considered transaction prices and are for reference only!

2. Regarding trademark copyright

All company names, trademarks, logos, product images, product descriptions, product brand names, etc. related to this website, and all intellectual property rights such as trademark copyright belong to the corresponding brand; This website is only for the convenience of product identification.
Please carefully read the buyer’s instructions to avoid unnecessary disputes.



If you want to learn about the product, please contact us.
Please provide the brand, model, and quantity for inquiry.


There are no reviews yet.

Be the first to review “Sinton Lifetime Measurement WCT-120TS”