Description
Brand:Sinton
model:WCT-120TS
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The WCT-120TS (Temperature Stage) instrument showcases the unique measurement and analysis techniques found with our WCT-120 instrument with the added capability to measure the carrier recombination lifetime of silicon wafers at temperatures ranging from 25°C to 200°C. Both the Quasi- Steady-State Photoconductance (QSSPC) lifetime measurement method developed by Sinton Instruments as well as the transient photoconductance decay technique can be used to measure wafer lifetime with this tool.
Primary application:
Measuring carrier recombination lifetimne in silicon wafers at a range of temperatures.
Other Applications:
-Monitoring initial material quality
-Detecting heavy metals contamination during wafer processing
-Evaluating surface passivation and emitter dopant diffusion
-Evaluating process-induced shunting using the implied I-V measurement
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Brand:Sinton
model:WCT-120TS
If you want to learn about the product, please contact us.
Please provide the brand, model, and quantity for inquiry.
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