Sinton Lifetime Tool WCT-120

The WCT-120 instruments utilize both the QSSPC and transient photoconductance decay techniques to measure the lifetimes of wafers in the range of 10ns to greater than 10ms. The QSSPC technique is ideal for monitoring multicrystalline wafers, dopant diffusions, and low lifetime samples. The transient photoconductance decay technique is ideal for monitoring high lifetimne samples at various processing steps.

The WCT-120 lifetime measurement also yields the implied open-circuit voltage (versus ilumination) curve,which is comparable to an I-V curve at each stage of a solar cell process.

Primary application:

Step-by-step monitoring and optimization of a fabrication process.

Other Applications:

-Monitoring initial material quality

-Detecting heavy metals contamination during wafer processing

-Evaluating surface passivation and emitter dopant diffusion

-Evaluating process-induced shunting using the implied I-V measurement

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