Sinton Post-Diffusion Process Control Suns-Voc MX

Perfect for paste- firing optimization and process control. Open-circuit method indicates the upper bound for any solar cell precursors after junction formation.The Suns-Voc MX stage is available as an accessory to the WCT-120 lifetime testing instrument or as a stand-alone measurement system.

Suns-Voc MX Applications:

By either probing the p+ and n+ regions directly or probing the metallization layer (if present),the ilumination-Voc curve can be measured. This curve can be displayed as our well-known the ilumination-Voc curve can be measured.

Suns-Voc MX Applications:

By either probing the p+ and n+ regions directly or probing the metallization layer (if present),the ilumination-Voc curve can be measured. This curve can be displayed as our well-known Suns-Voc plot or in the form of a standard photovoltaic curve which can be used to characterize shunting. The entire curve is measured at the open circuit, so it is free from the effects of series resistance. Comparing this curve to the final I-V curve gives a precise  measure of the series resistance in the cell.

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