Sinton Silicon Characterization BCT-400

Description

The BLS-I and BCT-400 measurement systems perform bulk lifetime measurements on monocrystalline ormulticrystalline silicon (ingots or bricks) without requiring surface passivation. Since lifetime measurements are among the most sensitive techniques for characterizing growth and contamination defects, these tools allow you to assess silicon quality directly after growth.

For the flexibility to measure all surface types (from 150-mm diameter to flat) choose the BLS-I. For  a compact tool designed to measure only flat surfaces, choose the BCT-400. The BCT-400 can also be mechanically integrated into an automation station and the software can be setup for seamless automated

Primary Applications:

-Qualifying high-purity silicon with lifetimes in the 1-10+ millisecond range

-Qualifying B-Cz silicon as-grown, without special surface preparation

-Characterizing lifetime and trap density in multicrystalline blocks

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