Sinton Bulk Silicon Characterization BCT-400

Simple and accurate contactless measurement of true bulk lifetimes on as-grown or shaped silicon. Complies with SEMI Standard PV-13.

Shock absorbing, retracting pads that conform to ingot curvature enable the BLS-I to measure any surface of as-grown or shaped ingots.

Primary Applications:

-Qualifying high-purity silicon with lifetimes in the 1-10+ millisecond range

-Qualifying B-Cz silicon as grown, without special surface preparation

一Characterizing lifetime and trap density in multicrystalline blocks

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